Patent · US Active

Method and system for ascertaining an expected device contour

US11091157B2 · kind B2 · utility

0Cited by
1References
9Claims
0Family size

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Key dates

Filing dateMay 2, 2019
Grant dateAug 17, 2021
Priority date
Expiry dateJan 14, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG05D1/0206
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

A method for ascertaining an expected contour of a mobile or stationary device for avoiding collisions, using at least one control unit that is internal external to the device includes: obtaining a movement trajectory of the device, which contains probability densities based on state estimation, at least based on expected values and covariances; obtaining a base polyhedron and an approximate contour of the device having a limited number of corners, a confidence interval within which a collision with the static and dynamic surroundings of the device is to be avoided being defined; transforming the base polyhedron to the at least one probability density of the movement trajectory that describes the state estimation; and, for each corner of the transformed base polyhedron, computing a transformed device contour, and ascertaining the expected contour of the device with inclusion of all transformed device contours.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.