Automated dynamic dimensional measurement systems and methods
US11092421B2 · kind B2 · utility
1Cited by
11References
22Claims
0Family size
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Key dates
| Filing date | Oct 9, 2018 |
| Grant date | Aug 17, 2021 |
| Priority date | — |
| Expiry date | Apr 29, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B5/204
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method system of reducing operator-induced error in measurements comprises a measurement tool, such as a diameter gage, that is configured to communicate electrical signals representative of measurements to a computing device, which is configured to receive the signals and to determine a value for the measurement without the operator having to interact with the tool to zero the gage, acquire the data or transmit the data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.