Patent · US Active

Reference plate and method for calibrating and/or checking a deflectometry sensor system

US11092432B2 · kind B2 · utility

0Cited by

0References

21Claims

0Family size

Assignee

MICRO-EPSILON-MESSTECHNIK GMBH & CO. KG · DE

Inventors

Stephan Zweckinger · Fürstenstein, DE
Josef Hochleitner · Herzogenaurach, DE
Hannes LOFERER · Ortenburg, DE
Robert Wagner · Neuburg am Inn, DE
Rainer Hesse · Ortenburg, DE

Key dates

Filing date	Oct 5, 2017
Grant date	Aug 17, 2021
Priority date	—
Expiry date	Mar 10, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG01N2021/9518
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The disclosure relates to a reference plate for calibrating and/or checking a deflectometry sensor system, said deflectometry sensor system including an image generation device and a capturing device having at least one capturing element, wherein the reference plate includes a reflective surface, and wherein, for the purpose of checking at least one system parameter of said deflectometry sensor system, the reflective surface is provided with a predefined pattern including markings. A corresponding method for calibrating and/or checking a deflectometry sensor system is moreover indicated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.