Conduction inspection device member and conduction inspection device
US11092620B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 8, 2017 |
| Grant date | Aug 17, 2021 |
| Priority date | — |
| Expiry date | Nov 19, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06755
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided is a conduction inspection device member, wherein cracks and voids are less likely to form in conductive parts, conduction performance is less likely to be impaired even when a conduction test is repeated, and contact marks are less likely to remain in the portion of the member in contact with a member to be tested. Also provided is a conduction inspection device comprising the conduction inspection device member. The conduction inspection device member comprises a substrate 13, through holes 11, and conductive parts 12. The multiple through holes 11 are arranged in the substrate 13, the conductive parts 12 are housed inside the through holes 11, and the conductive parts 12 contain conductive particles 2. The conductive particles 2 each comprise a substrate particle 21 and a conductive layer 22 on the surface of the substrate particle 21. The conductive layer 22 has multiple protrusions 23 on the outer surface thereof.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.