Measuring and removing the corruption of time-of-flight depth images due to internal scattering
US11092678B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 17, 2019 |
| Grant date | Aug 17, 2021 |
| Priority date | — |
| Expiry date | Apr 17, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/76
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Depth imagers can implement time-of-flight operations to measure depth or distance of objects. A depth imager can emit light onto a scene and sense light reflected back from the objects in the scene using an array of sensors. Timing of the reflected light hitting the array of sensors gives information about the depth or distance of objects in the scene. In some cases, corrupting light that is outside of a field of view of a pixel in the array of sensors can hit the pixel due to internal scattering or internal reflections occurring in the depth imager. The corrupting light can corrupt the depth or distance measurement. To address this problem, an improved depth imager can isolate and measure the corrupting light due to internal scattering or internal reflections occurring in the depth imager, and systematically remove the measured corrupting light from the depth or distance measurement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.