Patent · US Active

Manufacturing methods of semiconductor devices

US11092885B2 · kind B2 · utility

0Cited by
9References
18Claims
0Family size

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Key dates

Filing dateApr 10, 2020
Grant dateAug 17, 2021
Priority date
Expiry dateApr 10, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2119/06
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method of manufacturing a semiconductor device includes randomly placing a plurality of standard cells from a library in which the standard cells are pre-stored, designing an interconnection pattern in which the standard cells are connected randomly to each other, connecting the standard cells according to the interconnection pattern to generate a virtual layout, performing an optical proximity correction operation on the virtual layout using an optical proximity correction (OPC) model, and forming and verifying a mask corresponding to the virtual layout on which the optical proximity correction operation is performed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.