Systems and methods for detecting a fault or a model mismatch
US11093315B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Mar 22, 2019 |
| Grant date | Aug 17, 2021 |
| Priority date | — |
| Expiry date | Aug 16, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods for detecting a fault or model mismatch are disclosed. A system includes a processor, a memory, and one or more sensors. The sensors may detect data associated with an electronic device. The memory may store processor executable instructions to: compute T2 and Q statistics, over a time period, and apply a model mismatch and fault detection logic based on the T2 and Q statistics. The model mismatch and fault detection logic may: count consecutive instances where a T2 statistic exceeds a T2 threshold via a T2 counter, update a probability of fault based on the T2 counter, count consecutive instances where a Q statistic exceeds a Q threshold via a Q counter, update a probability of model mismatch based on the Q counter, and detect one of a fault or a model mismatch based on a probability of fault threshold and a probability of model mismatch threshold.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.