Progressive photon mapping method employing statistical model test
US11094111B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 30, 2018 |
| Grant date | Aug 17, 2021 |
| Priority date | — |
| Expiry date | Mar 30, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2215/12
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A progressive photon mapping method based on statistical test includes launching rays from the viewpoint to each pixel on the image plane and intersecting the three-dimensional scene to be rendered. If an intersection with diffuse surface is found on the tracing path, it is recorded as the hit point; a photon pass is performed: 31) performing photon tracing step; 32) performing photon collection processing for each hit point; 33) if the current iteration of photon pass does not need chi-square test, then performing flux accumulation and keeping the collection radius unchanged; if chi-square is required, evaluating the photon distribution quality; computing a collection radius according to the estimated photon distribution, and performing the flux accumulation in the current photon pass; 34) if the photon collection radius is reduced, then performing distributed ray tracing, generating new hit points, and go to 31), otherwise go to 31), start a new iteration of photon pass.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.