Inspection system for manufactured components
US11099119B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 28, 2020 |
| Grant date | Aug 24, 2021 |
| Priority date | — |
| Expiry date | Jul 28, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An inspection system includes a base plate, an array of fixtures, a plurality of light sources, and a drive mechanism. Each fixture has a first portion rotatably secured to the base plate and configured to rotate about a yaw axis and a second portion rotatably secured to the first portion and configured to rotate about a pitch axis. Each light source is secured to one of the fixtures and is configured to direct light at yaw and pitch angles relative to the base plate. The drive mechanism is configured to rotate the first portions of each fixture about each respective yaw axis and to rotate the second portions of each fixture about each respective pitch axis to adjust yaw and pitch angles of each light source, respectively.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.