Method for cleaning and coating a tip of a test probe utilized in a test system for an integrated circuit package
US11099212B2 · kind B2 · utility
2Cited by
9References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 23, 2020 |
| Grant date | Aug 24, 2021 |
| Priority date | — |
| Expiry date | Mar 23, 2040 |
Classification
- Technology area (CPC C)Chemistry; Metallurgy
- CPC primaryC11D2111/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for cleaning and coating a tip of a test probe in an integrated circuit package test system is provided. The method includes 1) saturating a brush tip comprising nonporous bristles with a solution of phosphonic acid; 2) applying the solution of phosphonic acid to the tip of the test probe with the brush tip to coat the tip of the test probe with the solution of phosphonic acid; and 3) allowing the solution of phosphonic acid to dry on the tip of the test probe and form a self-assembled monolayer of phosphonates thereon.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.