Method and circuitry for semiconductor device performance characterization
US11099224B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 22, 2020 |
| Grant date | Aug 24, 2021 |
| Priority date | — |
| Expiry date | May 22, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2882
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Performance measuring circuitry, for determining relative operational performance attributes of different types of a class of semiconductor component disposed on a semiconductor die, includes a first oscillator circuit including a plurality of first circuit element modules having a first circuit topology. The first oscillator circuit provides a first performance indication indicative of a collective performance attribute of all types of components in the class. A second oscillator circuit separate from the first oscillator circuit includes a plurality of second circuit element modules having a second circuit topology, and provides a second performance indication responsive to different contributions from different types of components in the class. A comparison circuit receives outputs of the first and second oscillator circuits and determines the relative performance characteristic of the different types of components. Dice may be binned according to performance, for use in assembly of operational circuits with different performance characteristics.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.