On-die reliability monitor for integrated circuit
US11099232B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 1, 2019 |
| Grant date | Aug 24, 2021 |
| Priority date | — |
| Expiry date | Jul 24, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2621
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Various embodiments provide a health monitor circuit including an n-type sensor to determine a first health indicator associated with n-type transistors of a circuit block and a p-type sensor to determine a second health indicator associated with p-type transistors of the circuit block. The n-type sensor and p-type sensor may be on a same die as the circuit block. The health monitor circuit may further include a control circuit to adjust one or more operating parameters, such as operating voltage and/or operating frequency, for the circuit block based on the first and second health indicators. Other embodiments may be described and claimed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.