Test space analysis across multiple combinatoric models
US11099975B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 24, 2019 |
| Grant date | Aug 24, 2021 |
| Priority date | — |
| Expiry date | Apr 12, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3692
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method includes defining functional coverage by a first test suite based on a first functional coverage model of a System Under Test (SUT). The first test suite includes a first plurality of tests. The first functional coverage model includes a first plurality of attributes. The first functional coverage model defines possible combinations of values of the first plurality of attributes. Functional coverage by a second test suite is defined based on a second functional coverage model which includes a second plurality of attributes. The second functional coverage model defines possible combinations of values of the second plurality of attributes. Subsets of the first and second plurality of attributes are determined. The subsets of attributes include exclusively common attributes between the first and the second plurality of attributes. A subset of the tests is selected. The selected subset is operative to cover the first and second subsets of the attributes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.