Flaw analysis of images
US11100550B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 1, 2019 |
| Grant date | Aug 24, 2021 |
| Priority date | — |
| Expiry date | Aug 14, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/0002
- WIPO fieldIT methods for management
- WIPO sectorElectrical engineering
Abstract
Systems and methods are disclosed to provide flaw accentuation to an image in an e-commerce online marketplace. In some embodiments, a method may include receiving at an online marketplace, from a seller through the Internet, an image of an item being listed for sale at the online marketplace and text related to the item being listed for sale; determining that the item includes a flaw based on the text related to the item being listed for sale or the image of the item; creating a flaw accentuation to the image; and creating a listing in the online marketplace for the item that includes the image and the flaw accentuation to the image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.