Combinatoric set completion through unique test case generation
US11106567B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 24, 2019 |
| Grant date | Aug 31, 2021 |
| Priority date | — |
| Expiry date | Apr 28, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3692
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems, methods, and computer-readable media are described for expanding test space coverage for testing performed on a System Under Test (SUT) through iterative test case generation from combinatoric pairwise outputs. At each test case generation iteration, a new set of test vectors is generated that provides complete pairwise coverage of the test space but that does not include any overlapping test vector with any previously generated set of test vectors. As such, cumulative m-wise test space coverage (where 2<m≤n) is incrementally increased through each iteration until the iterative process ceases when a desired percentage of m-wise test space coverage is achieved.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.