Measuring device for liquid crystal dielectric constant, measuring apparatus, measuring method
US11112440B2 · kind B2 · utility
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19Claims
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Key dates
| Filing date | Feb 1, 2019 |
| Grant date | Sep 7, 2021 |
| Priority date | — |
| Expiry date | Jul 12, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/2682
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure provides a measuring device, a measuring apparatus, and a measuring method for a dielectric constant of a liquid crystal. The measuring device includes: a first substrate and a second substrate disposed to be opposite to each other; a resonant structure layer disposed on a side of the first substrate facing the second substrate. a cavity for receiving the liquid crystal to be measured is defined between the first substrate and the second substrate. The above measuring device is applied to measurement of the dielectric constant of the liquid crystal in the terahertz wave band.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.