Method for detecting breakage of substrate of a switchable optical element and switchable optical device
US11112626B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 24, 2018 |
| Grant date | Sep 7, 2021 |
| Priority date | — |
| Expiry date | Aug 2, 2038 |
Classification
- Technology area (CPC E)Fixed Constructions
- CPC primaryE06B2009/2464
- WIPO fieldCivil engineering
- WIPO sectorOther fields
Abstract
A switchable optical element and method for detecting breakage of a substrate (A, B) of at least one switchable optical element (10) having a first substrate (A) and a second substrate (B), the first substrate (A) being coated with a first electrode and the second substrate (B) being coated with a second electrode, and a switchable layer (14), the switchable layer (14) being sandwiched between the first substrate (A) and second substrate (B), the first electrode and second electrode each having at least one contact, byi) measuring a change in a differential signal measured at two contacts of a substrate (A, B),ii) measuring a change in capacitance between the two substrates (A, B),iii) measuring a change in resistance of at least one of the substrates (A, B),iv) measuring a change in current applied to the switchable optical element (10).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.