Devices, systems, and methods for device-error analysis using computer vision and machine learning
US11113568B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 14, 2019 |
| Grant date | Sep 7, 2021 |
| Priority date | — |
| Expiry date | Jan 2, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V20/46
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Devices, systems, and methods obtain a video of a device, wherein the device includes one or more light emitters that are visible in the video; input the video to a first machine-learning model and executing the first machine-learning model, wherein the first machine-learning model outputs a time series of light-emitting states that indicate respective light-emitting states of the light emitters at respective times in the time series; and input the time series of light-emitting states to a second machine-learning model and executing the second machine-learning model, wherein the second machine-learning model outputs a status of the device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.