Systems and methods for detecting counterfeit memory
US11114179B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 13, 2018 |
| Grant date | Sep 7, 2021 |
| Priority date | — |
| Expiry date | Dec 13, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5002
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system for testing memory includes logic that is configured to perform various normal memory operations (e.g., erase, read and write operations) on a memory device and to determine operational parameters associated with the memory operations. As an example, the amount of time to perform one or more memory operations may be measured, or a number of errors resulting from the memory operations may be counted or otherwise determined. One or more of the operational parameters may then be analyzed to determine whether they are in a range expected for counterfeit memory. If so, the logic determines that the memory under test is counterfeit (e.g., is recycled or counterfeit) and provides a notification about the authenticity of the memory. The logic may also estimate the age of the memory based on the operational parameters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.