Image measurement device and method for the surface deformation of specimen based on sub-pixel corner detection
US11119016B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Oct 18, 2017 |
| Grant date | Sep 14, 2021 |
| Priority date | — |
| Expiry date | Dec 29, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30172
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A digital image measurement device and method for the surface deformation of specimen based on sub-pixel corner detection is disclosed. This digital image measurement device is composed of a new type of image pressure cell, a complementary metal-oxide-semiconductor (CMOS) camera, a camera bracket, a flexible lens hood, a computer and matching measurement software. This method discretizes the specimen into several four-node finite elements by printing grids on the specimen and takes corners of the grids as the nodes of the finite elements; tracks the deformation of the feature points in real time by edge detection and corner detection based on sub-pixel; captures the deformation of the whole surface of the specimen by the two flat mirrors which are at an 120° angle behind the specimen; achieves the observation of the deformation of the whole surface by conducting splicing and error correction on the three images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.