Micro resolution imaging range sensor system
US11119193B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Mar 28, 2019 |
| Grant date | Sep 14, 2021 |
| Priority date | — |
| Expiry date | Mar 28, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2290/65
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system configured to generate images includes one or more narrowband electromagnetic sources configured to emit a first radiation and a second radiation. The system also includes a detector configured to detect first reflected radiation off of an object and second reflected radiation off of the object, where the first reflected radiation results from the first radiation and the second reflected radiation results from the second radiation. The system further includes a processor operatively coupled to the detector and configured to generate an image of the object based at least in part on a first amplitude of the first reflected radiation and a second amplitude of the second reflected radiation. The processor is also configured to determine a depth profile of the object based at least in part on the first reflected radiation and the second reflected radiation detected by the detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.