Area scanning confocal microscopy (ASCM)
US11119299B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 10, 2019 |
| Grant date | Sep 14, 2021 |
| Priority date | — |
| Expiry date | Oct 10, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/6458
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An area scanning confocal microscope includes a pattern generation unit configured to generate or produce a line pattern comprising a plurality of lines, for example a plurality of straight parallel lines; a projection unit comprising a microscope objective configured to project the line pattern onto an object through the microscope objective, wherein the focal plane in which the line pattern is projected or imaged is tilted at a tilting angle with respect to an optical axis of the microscope, the tilting angle being equal to or greater than 0° and smaller than 90°, for example between 30° and smaller than 85°; and an imaging unit comprising a two-dimensional image detector configured to capture within one image frame of the image detector an image of the projected line pattern.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.