Component life cycle test categorization and optimization
US11119877B2 · kind B2 · utility
0Cited by
4References
20Claims
0Family size
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Key dates
| Filing date | Sep 16, 2019 |
| Grant date | Sep 14, 2021 |
| Priority date | — |
| Expiry date | Dec 15, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/263
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system for testing electrical components comprising a supplier test system operating on a first processor and configured to generate test data for a component and to store the component test data on a block chain. A board level test system operating on a second processor and configured to generate test data for a board and to store the board test data on the block chain. A test tracking system configured to request a first key to access to the component test data and a second key to access the board test data and to store the first key and the second key.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.