Latency measurement in an I/O operation of computer data storage
US11119885B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Oct 3, 2018 |
| Grant date | Sep 14, 2021 |
| Priority date | — |
| Expiry date | Oct 3, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L67/1097
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and a computer program product for latency measurement in an I/O operation. A storage system measures time periods taken in a write I/O operation and, using the measures time periods in the write I/O operation, the storage system monitors a delay that is caused by at least one of a host and a storage area network. A storage system measures time periods taken in a read I/O operation and, using the measures time periods in the read I/O operation, the storage system monitors a delay that is caused by at least one of a host and a storage area network in the read I/O operation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.