Method and system for three-dimensional profiling of an object
US11120294B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 8, 2019 |
| Grant date | Sep 14, 2021 |
| Priority date | — |
| Expiry date | Mar 3, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/757
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A first set of pixels forming a first set of rows of a first image acquired by an image acquisition device is received. A first partially corrected set of pixels forming a first partially corrected set of rows is generated from the first set of pixels where successive pixels of a row from the first partially corrected set of rows correspond to successive parallel lines in a plane defined by the sheet of light that are equally spaced along a first axis of a world coordinate system. Based on the first partially corrected set of pixels and based on a peak extraction mechanism, a first partially corrected set of points of the sheet of light is extracted. The first partially corrected set of points is transformed to obtain a first corrected set of points of the sheet of light that are corrected in a first and a second direction.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.