Patent · US Active

Jitter determination method and measurement instrument

US11121783B2 · kind B2 · utility

0Cited by

1References

14Claims

0Family size

Assignee

Rohde & Schwarz GmbH & Co. KG · DE

Inventors

Bernhard Nitsch · Birkenfeld, DE
Andreas Maier · Erlangen, DE
Adrian Ispas · Munich, DE

Key dates

Filing date	Jan 23, 2020
Grant date	Sep 14, 2021
Priority date	—
Expiry date	Jan 23, 2040

Classification

Technology area (CPC H)Electricity
CPC primaryH04L1/205
WIPO fieldTelecommunications
WIPO sectorElectrical engineering

Abstract

A jitter determination method for determining at least one jitter component of an input signal is described. The input signal is generated by a signal source, including: receiving the input signal; determining a step response based on the decoded input signal, the step response being associated with at least the signal source; and determining the at least one jitter component of the input signal based on at least one of the input signal and the determined step response. Further, a measurement instrument is described.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.