Method and device for optically measuring the surface of a measurement object

US11125550B2 · kind B2 · utility

Assignee

• MICRO-EPSILON-MESSTECHNIK GMBH & CO. KG · DE

Inventors

• Hannes LOFERER · Ortenburg, DE
• Reiner KICKINGEREDER · Ortenburg, DE
• Josef Reitberger · Rinchnach, DE
• Rainer Hesse · Ortenburg, DE
• Robert Wagner · Neuburg am Inn, DE

Key dates

• Filing date: May 18, 2018
• Grant date: Sep 21, 2021
• Expiry date: May 18, 2038

Classification

• Technology area (CPC H): Electricity
• CPC primary: H04N23/76
• WIPO field: Audio-visual technology
• WIPO sector: Electrical engineering

Abstract

A method of optically measuring a surface of a measurement object is disclosed. The method includes generating image light having an image pattern, projecting the generated image light onto the measurement object, and recording influenced light having an influenced image pattern. The image light is generated by an image generation device and the influenced light is captured by a capturing device. The influenced light is light that is reflected, scattered, diffracted, and/or transmitted by the measurement object based on interaction of the image light with the measurement object. The method further includes applying a correcting function to the image light. The correction function alters the image light such that the influenced image pattern recorded by the capturing device shows temporally and/or locally an at least approximately constant and/or homogenous and/or linear brightness. A device having an image generation device, image capture device, and correcting device is also disclosed.