Method and device for multiple edge detection
US11127132B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 16, 2018 |
| Grant date | Sep 21, 2021 |
| Priority date | — |
| Expiry date | Mar 13, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Described is a computer-implemented method for determining material interfaces of an object by means of at least one measurement of the object, a rasterized representation of the object having a plurality of pixels being produced by means of the measurement, each pixel having at least one piece of image information, which indicates a value of a measurement variable for the object at the position of the measurement point. The method comprises the determining of a parameterization of the rasterized representation of the object, the parameterization assigning at least one parameter to each of the measurement points of a subset of the measurement points of the representation, and the applying of at least one parameter-dependent edge-detection operator to the measurement points of the rasterized representation, an edge-detection operator being designed to determine the location of at least one material interface in the rasterized representation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.