Patent · US Active

Method and device for multiple edge detection

US11127132B2 · kind B2 · utility

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11Claims
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Assignee

Inventors

Key dates

Filing dateJan 16, 2018
Grant dateSep 21, 2021
Priority date
Expiry dateMar 13, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30164
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Described is a computer-implemented method for determining material interfaces of an object by means of at least one measurement of the object, a rasterized representation of the object having a plurality of pixels being produced by means of the measurement, each pixel having at least one piece of image information, which indicates a value of a measurement variable for the object at the position of the measurement point. The method comprises the determining of a parameterization of the rasterized representation of the object, the parameterization assigning at least one parameter to each of the measurement points of a subset of the measurement points of the representation, and the applying of at least one parameter-dependent edge-detection operator to the measurement points of the rasterized representation, an edge-detection operator being designed to determine the location of at least one material interface in the rasterized representation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.