Patent · US Active

Gate structures

US11127834B2 · kind B2 · utility

0Cited by
3References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 11, 2019
Grant dateSep 21, 2021
Priority date
Expiry dateOct 11, 2039

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/667

Abstract

The present disclosure generally relates to semiconductor structures and, more particularly, to gate structures and methods of manufacture. The method includes: forming a first gate structure and a second gate structure with gate materials; etching the gate materials within the second gate structure to form a trench; and depositing a conductive material within the trench so that the second gate structure has a metal composition different than the first gate structure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.