Patent · US Active

Integrated photonic test circuit

US11131710B2 · kind B2 · utility

0Cited by

1References

18Claims

0Family size

Assignee

COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES · FR

Inventors

Stéphane Bernabe · Grenoble, FR
Philippe Grosse · Saint-Égrève, FR

Key dates

Filing date	Nov 21, 2019
Grant date	Sep 28, 2021
Priority date	—
Expiry date	Jan 2, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG02B6/425
WIPO fieldTelecommunications
WIPO sectorElectrical engineering

Abstract

A photonic circuit testing device, including a photonic test chip including, on the side of a first surface of the chip: micropillars, each intended to be placed in contact with a corresponding electric connection pad of the photonic circuit; and first optical input/output ports, each intended to be optically coupled to a second corresponding optical input/output port of the photonic circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.