Patent · US Active

Systems and methods for analyzing manufacturing parameters

US11131978B2 · kind B2 · utility

0Cited by
11References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 19, 2016
Grant dateSep 28, 2021
Priority date
Expiry dateNov 6, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG05B2219/32366
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

A metal fabrication resource performance monitoring method includes collecting data representative of a parameter sampled during one or more metal fabrication operations of one or more metal fabrication resources, the one or more resources being selectable by a user from a listing of individual and groups of resources, receiving event data comprising a time that an event occurred, via at least one computer processor, determining a first analyzed system parameter from the collected data, via the at least one computer processor, populating a dashboard page with graphical indicia representative of the first analyzed system parameter before and after the event, and transmitting the dashboard page to a user-viewable display.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.