Devices, systems, and methods for anchor-point-enabled multi-scale subfield alignment
US11132791B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 19, 2020 |
| Grant date | Sep 28, 2021 |
| Priority date | — |
| Expiry date | Nov 19, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20021
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Devices, systems, and methods obtain a reference image; obtain a test image; globally align the test image to the reference image; select subfields in the test image; align the subfields in the test image with respective areas in the reference image; warp the test image based on the aligning of the subfields; select anchor points in the reference image; select anchor-edge points in the reference image; realign the subfields in the warped test image with respective areas in the reference image based on the anchor points in the reference image and on the anchor-edge points in the reference image; and warp the warped test image based on the realigning of the subfields.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.