Atomic interferometer system
US11133117B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 5, 2020 |
| Grant date | Sep 28, 2021 |
| Priority date | — |
| Expiry date | May 5, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V8/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An atom interferometer system includes a sensor cell comprising alkali metal atoms. An optical system generates first and second interrogation beams having respective first and second frequencies and a circular polarization. The optical system includes optics that provide the first and second interrogation beams through the sensor cell in a first direction and reflect the first and second interrogation beams back through the sensor cell in a second direction opposite the first direction and in a same circular polarization to drive the alkali metal atoms from a first energy state to a greater energy state during an interrogation stage of sequential measurement cycles. A detection system detects a state distribution of a population of the alkali metal atoms between the first energy state and the second energy state during the interrogation stage based on an optical response.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.