Patent · US Active

Measurement device and method of setting a measurement device

US11137444B2 · kind B2 · utility

0Cited by
2References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 28, 2019
Grant dateOct 5, 2021
Priority date
Expiry dateNov 6, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F3/0488
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A measurement device with automatic optimization capabilities comprises at least one signal processing component with a physical detector and a virtual detector component comprising at least one virtual detector for a signal processing component without physical detector. The physical detector is configured to physically measure a measurement value assigned to the signal processing component. The virtual detector component is configured to use a model of a signal processing chain from the physical detector to the location of the virtual detector. The model comprises at least one model parameter for the signal processing chain. The measurement device is configured to adapt the virtual detector component with respect to a measurement type for the signal to be measured. The virtual detector component is configured to use the model and the at least one measurement value. The virtual detector component is configured to determine a virtually determined value based on the model and the at least one measurement value. The measurement device is configured to use the virtually determined value to determine a setting for the measurement device. In addition, a method of setting a measurement d…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.