Measurement device and method of setting a measurement device
US11137444B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 28, 2019 |
| Grant date | Oct 5, 2021 |
| Priority date | — |
| Expiry date | Nov 6, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F3/0488
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measurement device with automatic optimization capabilities comprises at least one signal processing component with a physical detector and a virtual detector component comprising at least one virtual detector for a signal processing component without physical detector. The physical detector is configured to physically measure a measurement value assigned to the signal processing component. The virtual detector component is configured to use a model of a signal processing chain from the physical detector to the location of the virtual detector. The model comprises at least one model parameter for the signal processing chain. The measurement device is configured to adapt the virtual detector component with respect to a measurement type for the signal to be measured. The virtual detector component is configured to use the model and the at least one measurement value. The virtual detector component is configured to determine a virtually determined value based on the model and the at least one measurement value. The measurement device is configured to use the virtually determined value to determine a setting for the measurement device. In addition, a method of setting a measurement d…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.