System, apparatus, and method for estimating life of components
US11137751B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 5, 2019 |
| Grant date | Oct 5, 2021 |
| Priority date | — |
| Expiry date | Nov 5, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2119/04
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for estimating life of a component includes obtaining fracture data corresponding to a component. The fracture data includes a first dataset corresponding to a threshold region where the crack in the component is dormant below a fatigue threshold. The method further includes determining initial estimates of parameters of a crack growth rate model and parameters of temperature models corresponding to the crack growth rate model based on the fracture data. The method also includes computing optimized parameters of temperature models corresponding to the crack growth rate model, and a scatter parameter via simulation of a joint optimization method using the initial estimates. The method includes determining a cumulative distribution function based on the optimized parameters and the scatter parameter and estimating life of the component based on the cumulative distribution function.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.