Large range defect allocation system and method
US11138105B2 · kind B2 · utility
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Key dates
| Filing date | Dec 18, 2018 |
| Grant date | Oct 5, 2021 |
| Priority date | — |
| Expiry date | May 16, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B20/1883
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method includes moving data in a defect range from a defective area of a data storage medium to a reserve area of the data storage medium, and identifying the defect range by an address of a start of the defect range and a defect length. A logical address table is updated with the address of the start of the defect range, the defect length and an offset to the reserve area.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.