Patent · US Active

Dark field tensor tomography method, specimen holder and device

US11143603B2 · kind B2 · utility

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5Claims

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Assignee

TECHNISCHE UNIVERSITÄT MÜNCHEN · DE

Inventors

Florian Schaff · Melbourne, AU
Franz Pfeiffer · Unterföhring, DE

Key dates

Filing date	Nov 28, 2017
Grant date	Oct 12, 2021
Priority date	—
Expiry date	Jan 2, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG01N2223/419
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention relates to an X-ray CT method and in particular a registration-based dark-field tensor tomography method for testing a sample (60) by means of X-rays, with which method a sample (60) is consecutively scanned by means of X-rays in at least two fixed orientations differing from one another while rotating about a fixed rotation axis, in every orientation of the sample (60) on the basis of dark-field signals a plurality of scatter data sets is recorded, and the scatter data sets for different orientations are matched to one another by registration and combined into a common scatter data set reflecting a possible angular dependence of the scatter present due to the sample (60).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.