System, method, and apparatus for inspecting a surface
US11144063B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 4, 2018 |
| Grant date | Oct 12, 2021 |
| Priority date | — |
| Expiry date | Nov 10, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05D1/0038
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system includes an inspection robot having a plurality of input sensors, the plurality of input sensors distributed horizontally relative to an inspection surface and configured to provide inspection data of the inspection surface at selected horizontal positions; a controller, comprising: a position definition circuit structured to determine an inspection robot position of the inspection robot on the inspection surface; a data positioning circuit structured to interpret the inspection data, and to correlate the inspection data to the inspection robot position on the inspection surface; and wherein the data positioning circuit is further structured to determine position informed inspection data in response to the correlating of the inspection data with the inspection robot position.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.