Method and apparatus for device performance test
US11146342B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 29, 2021 |
| Grant date | Oct 12, 2021 |
| Priority date | — |
| Expiry date | Mar 29, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L43/50
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
The embodiments of the present disclosure provide a method and apparatus for device performance test, which relate to the field of communication technology. The method includes receiving a signal sent by a base station simulator; simulating a channel used for transmitting the signal, and performing simulated transmission on the signal based on the simulated channel; and sending the signal after the simulated transmission to respective probe in the anechoic chamber through an output interface connected to the probe, so that the probe radiates the received signal in the anechoic chamber in which the device under test is placed, and performs performance test on the device under test, where each probe is connected to an output interface of the channel simulator. By the solution provided by the embodiments of the present disclosure, the efficiency of device performance test can be improved.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.