Patent · US Active

Process for etching, and chamber cleaning and a gas therefor

US11149347B2 · kind B2 · utility

0Cited by
1References
9Claims
0Family size

Assignees

Inventors

Key dates

Filing dateMay 4, 2016
Grant dateOct 19, 2021
Priority date
Expiry dateJun 6, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/31116
  • WIPO fieldChemical engineering
  • WIPO sectorChemistry

Abstract

The present invention relates to a process for cleaning chambers of apparatus used for semiconductor manufacturing with a gas mixture comprising or consisting of fluorine, nitrogen and argon as well as said gas mixtures.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.