Process for etching, and chamber cleaning and a gas therefor
US11149347B2 · kind B2 · utility
0Cited by
1References
9Claims
0Family size
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Key dates
| Filing date | May 4, 2016 |
| Grant date | Oct 19, 2021 |
| Priority date | — |
| Expiry date | Jun 6, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/31116
- WIPO fieldChemical engineering
- WIPO sectorChemistry
Abstract
The present invention relates to a process for cleaning chambers of apparatus used for semiconductor manufacturing with a gas mixture comprising or consisting of fluorine, nitrogen and argon as well as said gas mixtures.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.