Device and method for detecting defect contour with omnidirectionally equal sensitivity based on magnetic excitation
US11150311B2 · kind B2 · utility
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13Claims
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Key dates
| Filing date | Jun 17, 2020 |
| Grant date | Oct 19, 2021 |
| Priority date | — |
| Expiry date | Jun 17, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01F7/0278
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device and a method for detecting a defect contour with omnidirectionally equal sensitivity based on magnetic excitation are provided. The device includes a magnetic sensor array arranged in a spatially uniform magnetic field and configured to collect a magnetic field signal, and a data analysis module configured to analyze the magnetic field signal, extract a distorted magnetic field signal, and obtain an image of the defect contour based on the distorted magnetic field signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.