Method and apparatus for detecting image defects, computing device, and computer readable storage medium
US11151712B2 · kind B2 · utility
1Cited by
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17Claims
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Key dates
| Filing date | Aug 30, 2019 |
| Grant date | Oct 19, 2021 |
| Priority date | — |
| Expiry date | Dec 9, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30121
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for detecting image defects is described, which includes obtaining an image to be detected, down-sampling the image to be detected to obtain a down-sampled image, de-cluttering the down-sampled image to obtain a de-cluttered image, restoring the de-cluttered image into a restored image having the same resolution as the image to be detected so as to be used as a background image, and comparing the image to be detected with the background image to determine defects in the image to be detected. An apparatus for detecting image defects, a computing device and a storage medium are also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.