High-lane count optical transceiver with built-in self test
US11153009B1 · kind B1 · utility
3Cited by
3References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 21, 2020 |
| Grant date | Oct 19, 2021 |
| Priority date | — |
| Expiry date | Jul 21, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B10/40
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
An optical device such as an optical transceiver can include a cascaded built-in self-test structure that can be configured in testing mode using an active power mode and can sufficiently attenuate light away from a loopback path in an inactive power mode. The optical device can include a wafer top emitter that can be used to tune a light source for testing and calibration of optical components while the built-in self-test structure is in active mode.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.