Method for determining a geofence parameter of a geofence area related to a point of interest and related electronic device
US11153710B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 16, 2019 |
| Grant date | Oct 19, 2021 |
| Priority date | — |
| Expiry date | Nov 16, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04W4/021
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
The present disclosure provides a method, performed at an electronic device, for determining a geofence parameter of a geofence area related to a point of interest, POI. The method comprises obtaining a location of the POI, obtaining first POI data based on the location of the POI. The method may comprise determining, based on the location of the POI, one or more entities in proximity of the POI. The method comprises obtaining second POI data related to at least one entity of the one or more entities. The method comprises generating a set of enclosing features related to the POI based on the second POI data, wherein generating the set of enclosing features comprises applying a processing scheme to the second POI data; and determining a geofence parameter based on the first POI data and the set of enclosing features.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.