Abnormality determination device, abnormality determination method, and non-transitory recording medium
US11156476B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 5, 2018 |
| Grant date | Oct 26, 2021 |
| Priority date | — |
| Expiry date | May 19, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B23/0221
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided are an abnormality determination device and the like that are able to accurately determine abnormalities regarding an inspection subject. The abnormality determination device is configured to calculate a scatter degree of differences between prediction information on an observation target and observation information on the observation target, the prediction information being an information generated in accordance with a scenario that represents an aspect of state change of the observation target, the observation information generated by an inspection target; and determine whether or not the inspection target is abnormal based on the calculated degree.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.