Systems and methods for X-ray diffraction virtual spectroscopy
US11156568B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 9, 2020 |
| Grant date | Oct 26, 2021 |
| Priority date | — |
| Expiry date | Apr 9, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/639
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Various aspects include methods and devices for reducing the scanning time for an X-ray diffraction scanner system by increasing the count rate or efficiency of the energy discriminating X-ray detector. In a first embodiment, the count rate of the energy discriminating X-ray detector is increased by increasing the number of detectors counting X-ray scatter photon in particular energy bins by configuring individual pixel detectors within a 2-D X-ray detector array to count photons within specific energy bins. In a second embodiment, the gain of amplifier components in the detector processing circuitry is increased in order to increase the energy resolution of the detector. In a third embodiment, the individual pixel detectors within a 2-D X-ray detector array are configured to count photons within specific energy bins and the gain of amplifier components in the detector processing circuitry is increased in order to increase the energy resolution of the detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.