In-system scan test of electronic devices
US11156660B1 · kind B1 · utility
1Cited by
1References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 19, 2019 |
| Grant date | Oct 26, 2021 |
| Priority date | — |
| Expiry date | Dec 19, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/331
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for testing of one or more electronic devices is disclosed. In an embodiment, a processor transmits one or more test vectors to the one or more electronic devices. The one or more test vectors are based upon configuration parameters of the processor and input-output parameters of the one or more electronic devices. The processor receives scan vectors from the one or more electronic devices in response to the plurality of test vectors. The processor verifies in-system behavior of the one or more electronic devices based upon comparing received scan vectors with expected scan vectors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.