Automated implant movement analysis systems and related methods
US11158062B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 27, 2020 |
| Grant date | Oct 26, 2021 |
| Priority date | — |
| Expiry date | Jun 6, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/03
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods, systems, workstations, and computer program products that provide automated implant analysis of batches of image data sets of a plurality of different patients having an implant coupled to bone using a first data set of a first patient from the batch of image data sets, the first data set comprising a first image stack and a second image stack and allowing a user to select parameter settings for implant movement analysis of the implant including selecting a first object of interest and a second reference object. Measurements of movement of the implant and/or coupled bone can be automatically calculated and selected parameter settings can be automatically propagated to other image data sets of other patients of the batch of image data sets and measurements for the batch of image data sets of others of the different patients can be automatically calculated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.