System and method for correcting image through estimation of distortion parameter
US11164292B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 8, 2019 |
| Grant date | Nov 2, 2021 |
| Priority date | — |
| Expiry date | Apr 1, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30201
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Provided are a system and method for correcting an image through estimation of a distortion parameter. The method includes receiving a distorted image including one or more measurement targets, extracting a plurality of feature points from each of the measurement targets, classifying the one or more measurement targets as a distorted target and an undistorted target by comparing distances between the plurality of extracted feature points and a center point of the received distorted image with each other, estimating a distortion parameter on the basis of standard deviations of a plurality of feature points of the classified distorted target and undistorted target, and correcting the received distorted image on the basis of the estimated distortion parameter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.