Device for inspecting display device and inspecting method thereof
US11164305B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 28, 2019 |
| Grant date | Nov 2, 2021 |
| Priority date | — |
| Expiry date | May 12, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30121
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A device for inspecting a display device includes a camera to photograph a substrate and generate image information, a pixel value setter to set pixel values corresponding to respective luminances of a plurality of pixels from the image information, and to detect a crack region based on the pixel values, a stress calculator to calculate a critical stress of a crack included in the crack region, and a determiner to check whether the critical stress is equal to or greater than a first threshold value and to determine whether the substrate has defects. The stress calculator calculates a critical stress of the substrate by using fracture toughness, a shape factor, and a crack depth. The shape factor is set to increase as a compressive stress of the substrate increases.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.